Cost model driven test resource partitioning for SoCs
نویسندگان
چکیده
منابع مشابه
Test Resource Partitioning for SOCs
increasing design sizes have led to highly complex, billion-transistor integrated circuits. Testing these complex ICs to weed out defective parts has become a major challenge. To reduce design and manufacturing costs, testing must be quick and effective. The time it takes to test an IC depends on test data volume. The rapidly increasing number of transistors in ICs has spurred enormous growth i...
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When moving into the billion-transistor era, the wired interconnects used in conventional SoC test control models are rather restricted in not only system performance, but also signal integrity and transmission with continued scaling of feature size. On the other hand, recent advances in silicon integrated circuit technology are making possible tiny low-cost transceivers to be integrated on chi...
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Product development economics and specs drive the need for on chip embedded test functionality. However, optimal partitioning of test functionality between a tester and a SOC is a non-trivial task, which must be solved during the system analysis phase. Hence, at system level, a trade-off analysis must be performed, in order to evaluate the costs and benefits of different partitioning schemes. T...
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One day, you will discover a new adventure and knowledge by spending more money. But when? Do you think that you need to obtain those all requirements when having much money? Why don't you try to get something simple at first? That's something that will lead you to know more about the world, adventure, some places, history, entertainment, and more? It is your own time to continue reading habit....
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We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the aim of minimizing the total test application time and the routing of the added TAM (test access mechanism) wires. A feature of our approach is that it pinpoints bottlenecks that are likely to limit the test solution, which...
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ژورنال
عنوان ژورنال: Electronics Letters
سال: 2006
ISSN: 0013-5194
DOI: 10.1049/el:20061556